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Title
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
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Package
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Springer Nature - Springer Engineering eBooks 2007 English International
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Platform
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SpringerLink
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URL
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https://link.springer.com/10.1007/0-387-46547-2
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Status
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Current
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Publication Type
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Monograph
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Medium
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Empty
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Language
-
-
First Author
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Sachdev
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First Editor
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Empty
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Publisher Name
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Springer US
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Date First in Print
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2007-01-01
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Date First Online
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2007-01-01
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Access Start Date
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Empty
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Access End Date
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Empty
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Volume Number
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34
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Edition Statement
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2
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Access Type
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Paid
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Note
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Empty
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Last Changed External
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Empty
- Date Created
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2022-02-14 08:49:23
- Last Updated
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2024-06-12 20:00:54
- UUID
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d9286285-5db0-4128-91b9-4fb10901fb1d
Identifier Namespace Name |
Identifier Namespace Value |
Identifier |
eISBN
|
eisbn
|
978-0-387-46547-0
|
ISBN
|
isbn
|
978-0-387-46546-3
|
Title_ID
|
title_id
|
10.1007/0-387-46547-2
|
Dewey Decimal Classification |
-
Series
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Empty
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Parent publication title ID
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5994
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Superseding publication title ID
-
Empty
-
Preceding publication title ID
-
Empty
Price Type |
Value |
Currency |