- Date Created
- 2020-01-13 14:01:49
- Last Updated
- 2020-01-13 14:01:49
- UUID
- 7a997116-7c01-49f9-b710-6d8cce666b88
Identifier: 978-0-387-46547-0
- Identifier Namespace
- eisbn
- Identifier
- 978-0-387-46547-0
Identified Components with same Identifier:
| Title | Package | Namespace |
|---|---|---|
| Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Current) | Springer Nature - Springer Engineering eBooks 2007 English International | eisbn |