- Date Created
- 2020-01-13 14:01:49
- Last Updated
- 2020-01-13 14:01:49
- UUID
- b913f67b-8a06-4ba6-aba2-3561b8ca6eb9
Identifier: 978-0-387-46546-3
- Identifier Namespace
- isbn
- Identifier
- 978-0-387-46546-3
Identified Components with same Identifier:
| Title | Package | Namespace |
|---|---|---|
| Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Current) | Springer Nature - Springer Engineering eBooks 2007 English International | isbn |