- Date Created
- 2022-02-11 06:43:34
- Last Updated
- 2022-02-11 06:43:34
- UUID
- cb6b5b62-52e1-466f-867a-d9cf527c8e09
Identifier: 10.1007/0-387-46547-2
- Identifier Namespace
- title_id
- Identifier
- 10.1007/0-387-46547-2
Identified Components with same Identifier:
| Title | Package | Namespace |
|---|---|---|
| Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Current) | Springer Nature - Springer Engineering eBooks 2007 English International | title_id |