-
Title
-
An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
-
Package
-
IOP Concise Physics
-
Platform
-
IOPscience
-
URL
-
https://iopscience.iop.org/book/978-1-6817-4088-1
-
Status
-
Current
-
Publication Type
-
Monograph
-
Medium
-
Book
-
Language
-
-
First Author
-
Sarah Fearn
-
First Editor
-
Empty
-
Publisher Name
-
Empty
-
Date First in Print
-
Empty
-
Date First Online
-
Empty
-
Access Start Date
-
Empty
-
Access End Date
-
Empty
-
Volume Number
-
Empty
-
Edition Statement
-
Empty
-
Access Type
-
Empty
-
Note
-
Empty
-
Last Changed External
-
Empty
- Date Created
-
2020-01-23 08:26:26
- Last Updated
-
2020-01-23 08:26:26
- UUID
-
2d6a6efb-2ab8-4a49-8327-b61d2da82e0d
Identifier Namespace Name |
Identifier Namespace Value |
Identifier |
eISBN
|
eisbn
|
978-1-6817-4088-1
|
ISBN
|
isbn
|
978-1-6817-4024-9
|
Dewey Decimal Classification |
-
Series
-
Empty
-
Parent publication title ID
-
Empty
-
Superseding publication title ID
-
Empty
-
Preceding publication title ID
-
Empty
Price Type |
Value |
Currency |