- Date Created
- 2020-01-23 08:25:05
- Last Updated
- 2020-01-23 08:25:05
- UUID
- 18d1a92d-a84c-4496-a864-d827b2ee2d23
Identifier: 978-1-6817-4088-1
- Identifier Namespace
- eisbn
- Identifier
- 978-1-6817-4088-1
Identified Components with same Identifier:
| Title | Package | Namespace |
|---|---|---|
| An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (Current) | IOP Concise Physics | eisbn |