- Date Created
- 2020-01-23 08:25:05
- Last Updated
- 2020-01-23 08:25:05
- UUID
- 743bcfc0-3c5c-493b-9f03-e037637d99d0
Identifier: 978-1-6817-4024-9
- Identifier Namespace
- isbn
- Identifier
- 978-1-6817-4024-9
Identified Components with same Identifier:
| Title | Package | Namespace |
|---|---|---|
| An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (Current) | IOP Concise Physics | isbn |