- Date Created
- Last Updated
- UUID
- da84177d-53d1-4d5d-b4d8-fdd06fdad00a
Title Update Infos: Computed Electron Micrographs and Defect Identification
- Package Update Info
- Book Series Backfile Package - Chemistry [YBCHEM]
- Description
- Delete Title 'Computed Electron Micrographs and Defect Identification' because is not in KBART!
- Status
- Successful
- Type
- Changed Title
- Start Time
- 2024-07-09
- End Time
- 2024-07-09
- KBART Field
- status
- Old Value
- Deleted
- New value
- Deleted