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Title
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Computed Electron Micrographs and Defect Identification
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Package
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Book Series Backfile Package - Chemistry [YBCHEM]
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Platform
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ScienceDirect
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URL
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https://www.sciencedirect.com/science/bookseries/00703230/7
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Status
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Deleted
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Publication Type
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Monograph
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Medium
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Empty
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Language
-
-
First Author
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Empty
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First Editor
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A.K. HEAD, P. HUMBLE, L.M. CLAREBROUGH, A.J. MORTON, C.T. FORWOOD
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Publisher Name
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Elsevier
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Date First in Print
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1973-01-01
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Date First Online
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2012-12-02
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Access Start Date
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Empty
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Access End Date
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Empty
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Volume Number
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7
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Edition Statement
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Empty
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Access Type
-
Empty
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Note
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Empty
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Last Changed External
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Empty
- Date Created
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2024-07-08 20:41:45
- Last Updated
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2024-07-09 20:00:40
- UUID
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79b7e510-a093-4edd-8111-3f49e3bb60d9
| Identifier Namespace Name |
Identifier Namespace Value |
Identifier |
|
eISBN
|
eisbn
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978-0-7204-1757-9
|
|
Title_ID
|
title_id
|
9780720417579
|
| Dewey Decimal Classification |
-
Series
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Empty
-
Parent publication title ID
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00703230
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Superseding publication title ID
-
Empty
-
Preceding publication title ID
-
Empty
| Price Type |
Value |
Currency |