- Date Created
- 2022-09-28 20:10:32
- Last Updated
- 2022-09-28 20:10:32
- UUID
- 669d1fd3-7a01-4f27-adde-d0e80259f1b9
Title Update Infos: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
- Package Update Info
- Springer Nature - Springer Engineering eBooks 2007 English International
- Description
- Changes in Title 'Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits'
- Status
- Successful
- Type
- Changed Title
- Start Time
- 2022-09-28
- End Time
- 2022-09-28
- KBART Field
- date_monograph_published_online
- Old Value
- Empty
- New value
- 2007