- Date Created
- Last Updated
- UUID
- 4b87db9b-6e84-4abb-a27c-05054fdce86c
Title Update Infos: Thermal Testing of Integrated Circuits
- Package Update Info
- Springer Nature - Springer Book Archive - Springer Engineering 2000-2004
- Description
- Delete Title 'Thermal Testing of Integrated Circuits' because is not in KBART!
- Status
- Successful
- Type
- Changed Title
- Start Time
- 2024-05-09
- End Time
- 2024-05-09
- KBART Field
- status
- Old Value
- Deleted
- New value
- Deleted