Title: In-Circuit Testing
- Title
- In-Circuit Testing
- Platform
- SpringerLink
- Status
- Current
- Publication Type
- Monograph
- Medium
- Empty
- Language
-
- First Author
- Bateson
- First Editor
- Empty
- Publisher Name
- Springer Netherlands
- Date First in Print
- 1985-01-01
- Date First Online
- 1985-01-01
- Access Start Date
- Empty
- Access End Date
- Empty
- Volume Number
- Empty
- Edition Statement
- 1
- Access Type
- Paid
- Note
- Empty
- Last Changed External
- Empty
- Date Created
- 2022-02-01 06:33:40
- Last Updated
- 2024-08-05 21:18:24
- UUID
- fb6ea529-bd14-4f1a-a8bd-1668fa27c7a7
Identifier Namespace Name | Identifier Namespace Value | Identifier |
---|---|---|
eISBN | eisbn | 978-94-011-7009-3 |
ISBN | isbn | 978-0-442-21284-1 |
Title_ID | title_id | 10.1007/978-94-011-7009-3 |
- Subject Area
- Empty
Dewey Decimal Classification |
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- Series
- Empty
- Parent publication title ID
- Empty
- Superseding publication title ID
- Empty
- Preceding publication title ID
- Empty
- Open Access
- Empty
Price Type | Value | Currency |
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