Title: VLSI Test Principles and Architectures
- Title
- VLSI Test Principles and Architectures
- Platform
- ScienceDirect
- Status
- Current
- Publication Type
- Monograph
- Medium
- Empty
- Language
-
- First Author
- Empty
- First Editor
- Laung-Terng Wang, Cheng-Wen Wu and Xiaoqing Wen
- Publisher Name
- Morgan Kaufmann
- Date First in Print
- 2006-01-01
- Date First Online
- 2007-09-02
- Access Start Date
- Empty
- Access End Date
- Empty
- Volume Number
- Empty
- Edition Statement
- Empty
- Access Type
- Paid
- Note
- Empty
- Last Changed External
- Empty
- Date Created
- 2021-11-11 21:11:25
- Last Updated
- 2024-09-09 20:45:33
- UUID
- 906d9460-d27b-4360-8eba-20dd76ae2ae8
Identifier Namespace Name | Identifier Namespace Value | Identifier |
---|---|---|
eISBN | eisbn | 978-0-12-370597-6 |
Title_ID | title_id | 9780123705976 |
- Subject Area
- Empty
Dewey Decimal Classification |
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- Series
- Empty
- Parent publication title ID
- Empty
- Superseding publication title ID
- Empty
- Preceding publication title ID
- Empty
- Open Access
- Empty
Price Type | Value | Currency |
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