Title: VLSI Test Principles and Architectures

Title
VLSI Test Principles and Architectures
Package
Book Series Backfile Package - Chemistry [YBCHEM]
Platform
ScienceDirect
URL
https://www.sciencedirect.com/science/book/9780123705976 
Status
Deleted
Publication Type
Monograph
Medium
Empty
Language
First Author
Empty
First Editor
Laung-Terng Wang, Cheng-Wen Wu and Xiaoqing Wen
Publisher Name
Morgan Kaufmann
Date First in Print
2006-01-01
Date First Online
2007-09-02
Access Start Date
Empty
Access End Date
Empty
Volume Number
Empty
Edition Statement
Empty
Access Type
Empty
Note
Empty
Last Changed External
Empty

Curated By

Date Created
2024-07-08 20:45:00
Last Updated
2024-07-09 20:00:40
UUID
7ff28816-f197-4838-a79d-98f48cd41016
Identifier Namespace Name Identifier Namespace Value Identifier
eISBN eisbn 978-0-12-370597-6
Title_ID title_id 9780123705976
Subject Area
Empty
Dewey Decimal Classification
Series
Empty
Parent publication title ID
Empty
Superseding publication title ID
Empty
Preceding publication title ID
Empty
Open Access
Empty
Price Type Value Currency


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