Title: Elements of Electromigration : Electromigration in 3D IC technology

Title
Elements of Electromigration : Electromigration in 3D IC technology
Package
Taylor & Francis - HBZ Consortia Package
Platform
Taylor & Francis eBooks
URL
https://www.taylorfrancis.com/books/9781003384281 
Status
Current
Publication Type
Monograph
Medium
Book
Language
First Author
Tu, King-Ning
First Editor
Empty
Publisher Name
CRC Press
Date First in Print
2024-01-19
Date First Online
2024-01-19
Access Start Date
2022-11-14
Access End Date
2024-12-31
Volume Number
Empty
Edition Statement
Empty
Access Type
Paid
Note
Empty
Last Changed External
2024-08-26

Curated By

Date Created
2024-01-22 21:00:44
Last Updated
2024-08-26 21:37:07
UUID
14d4a271-5b4e-4ff0-86ce-5a6375630009
Identifier Namespace Name Identifier Namespace Value Identifier
DOI doi 10.1201/9781003384281  
eISBN eisbn 9781003384281
ISBN isbn 9781032470276
Title_ID title_id 10.1201/9781003384281
Subject Area
Engineering & Technology
Dewey Decimal Classification
Series
Empty
Parent publication title ID
Empty
Superseding publication title ID
Empty
Preceding publication title ID
Empty
Open Access
Empty
Price Type Value Currency
list 150.0 USD
list 120.0 EUR
list 120.0 GBP


Loading