Title: VLSI Test Principles and Architectures

Title
VLSI Test Principles and Architectures
Package
ProQuest_Ebook Central DDA
Platform
Ebook Central
URL
https://ebookcentral.proquest.com/lib/ebooksnrw/detail.action?docID=288757 
Status
Current
Publication Type
Monograph
Medium
Book
Language
English
First Author
Wang, Laung-Terng
First Editor
Empty
Publisher Name
Elsevier Science & Technology
Date First in Print
2006-08-14
Date First Online
2006-08-14
Access Start Date
Empty
Access End Date
Empty
Volume Number
Empty
Edition Statement
1
Access Type
Paid
Note
Empty
Last Changed External
2023-07-28

Curated By

Date Created
2023-04-28 18:24:00
Last Updated
2023-11-16 17:04:31
UUID
5f944072-961e-4e90-b59a-b7d50a54dc64
Identifier Namespace Name Identifier Namespace Value Identifier
eISBN eisbn 9780080474793
ISBN isbn 9780123705976
Title_ID title_id 288757
Subject Area
Engineering: Electrical; Engineering
Dewey Decimal Classification
Series
Morgan Kaufmann Series in Systems on Silicon
Parent publication title ID
Empty
Superseding publication title ID
Empty
Preceding publication title ID
Empty
Open Access
Empty
Price Type Value Currency
list 104.34 USD
list 97.8 EUR


Loading