Title: Identification of Defects in Semiconductors

Title
Identification of Defects in Semiconductors
Package
ProQuest_Ebook Central DDA
Platform
Ebook Central
URL
https://ebookcentral.proquest.com/lib/ebooksnrw/detail.action?docID=405275 
Status
Current
Publication Type
Monograph
Medium
Book
Language
English
First Author
Willardson, R. K.
First Editor
Empty
Publisher Name
Elsevier Science & Technology
Date First in Print
1998-10-27
Date First Online
1998-10-27
Access Start Date
Empty
Access End Date
Empty
Volume Number
Empty
Edition Statement
1
Access Type
Paid
Note
Empty
Last Changed External
2023-08-18

Curated By

Date Created
2023-04-28 18:14:44
Last Updated
2023-11-16 17:00:59
UUID
ac397a91-87b5-4466-90d3-9a775483e5d0
Identifier Namespace Name Identifier Namespace Value Identifier
eISBN eisbn 9780080864495
ISBN isbn 9780127521657
Title_ID title_id 405275
Subject Area
Science: Physics; Science; Science: Chemistry
Dewey Decimal Classification
Series
Empty
Parent publication title ID
Empty
Superseding publication title ID
Empty
Preceding publication title ID
Empty
Open Access
Empty
Price Type Value Currency
list 300.0 USD
list 281.19 EUR


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