- Date Created
- 2022-02-01 06:07:56
- Last Updated
- 2022-02-01 06:07:56
- UUID
- 05878aa6-191c-49f3-a2f2-ae218eb2b1cf
Identifier: 978-1-4020-7076-1
- Identifier Namespace
- isbn
- Identifier
- 978-1-4020-7076-1
Identified Components with same Identifier:
Title | Package | Namespace |
---|---|---|
Thermal Testing of Integrated Circuits (Deleted) | Springer Nature - Springer Book Archive - Springer Engineering 2000-2004 | isbn |
Thermal Testing of Integrated Circuits (Current) | Springer Book Archive - Engineering | isbn |